Atomic Force Microscope (JOEL)


  • Select among four scanners with scan ranges up to 200m square x-y imaging area and up to 10m vertical range
  • Sample size up to 15mm diameter and up to 5mm thick
  • Tip / Cantilever Holders Tapping Mode (air) Cantilever HolderForce Modulation and Tapping Mode (fluid)
  • Electric Force Cantilever Holder
  • STM Converter
  • Low-Current STM Converter
  • Isolation Silicone Vibration Pad
  • Acoustic cover


  • Electronics Digital Signal Processor (DSP) with a 20MHz peak rate for arithmetic operations
  • x, y, and z scanner drives with 220V range
  • Three independent 16-bit DACs on each axis for scan pattern, scaling, and offset
  • Scan calibration maintained regardless of scan size or offset
  • Calibrated data from both the trace and retrace lines of a scan simultaneously displayed and captured
  • Display of both the up-to-down scan and the down-to-up scan for protection against drift artifacts
  • x-y electronic noise <1mV peak-to-peak for 10V scan independent of offset
  • Four auxiliary DACs, three with 10V outputs and one with 12V and 220V outputs, all with 16-bit resolution
  • Two 10V ADCs with 14-bit resolution and software-selectable filters; one input has four-way multiplexing
atomic force microscope

The Atomic Force Microscopy allows for discrimination of surface features at the atomic level. This methodology is useful for the determination of line sequence and the characterization of surface features such as staple marks, creases in paper or other irregularities in the paper surface.

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