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About Albert Lyter

Video Densitometer

Thin Layer Chromatography (TLC)

Scanning Electron Microscope

Fourier Transform Infrared Spectroscopy

Atomic Force Microscopy

X-ray Photoelectron Spectroscopy


Federal Forensic Associates, Inc.



The Atomic Force Microscopy allows for discrimination of surface features at the atomic level.  This methodology is useful for the determination of line sequence and the characterization of surface features such as staple marks, creases in paper or other irregularities in the paper surface.

Scanner Select among four scanners with scan ranges up to 200�m square x-y imaging area and up to 10�m vertical range

Sample Size Up to 15mm diameter and up to 5mm thick Tip/Cantilever Holders:

Tip/Cantilever Holders Tapping Mode (air) Cantilever Holder
Force Modulation and Tapping Mode (fluid)
Electric Force Cantilever Holder
STM Converter
Low-Current STM Converter

Isolation Silicone Vibration Pad
Acoustic cover

Controller Electronics Digital Signal Processor (DSP) with a 20MHz peak rate for arithmetic operations
x, y, and z scanner drives with �220V range
Three independent 16-bit DACs on each axis for scan pattern, scaling, and offset
Scan calibration maintained regardless of scan size or offset
Calibrated data from both the trace and retrace lines of a scan simultaneously displayed and captured
Display of both the up-to-down scan and the down-to-up scan for protection against drift artifacts
x-y electronic noise <1mV peak-to-peak for 10V scan independent of offset
Four auxiliary DACs, three with �10V outputs and one with �12V and �220V outputs, all with 16-bit resolution
Two �10V ADCs with 14-bit resolution and software-selectable filters; one input has four-way multiplexing

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